Sibress unveils ultra compact digital microscope

19 February 2013

Measurement instrument manufacturer Sibress has launched a new "ultra compact" digital microscope for printed dot measurement.

Coupled with the company's SIS software, which features a built-in calibration function, the system scans printed dots that are then analysed automatically, with results shown in either dot percentage area, lines/cm or lines/inch.

The system's ruler displays distances in µm, angles in degree and length in distance. The user can both store and retrieve images, while the software is claimed to offer a comprehensive set of measuring tools, with functions to measure the diameter and distance of printed dots.

The new Sibress microscope is equipped with a CMOS sensor and a "powerful optical system" that enables the enlargement of images in full-colour mode.

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